Article citationsMore>>

Sakamoto, K. and Nishi, K. (1987) Segregation and Transport Coefficients of Impurities at the Si/SiO2 Interface. Journal of Applied Physics, 61, 1986-1988.
http://dx.doi.org/10.1063/1.338089

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top