Rukhin, A., Soto, J., Nechvatal, J., Barker, E., Leigh, S., Levenson, M., Banks, D., Heckert, A., Dray, J., Vo, S., Rukhin, A., Soto, J., Smid, M., Leigh, S., Vangel, M., Heckert, A., Dray, J. and Bassham Iii, L.E. (2010) Statistical Test Suite for Random and Pseudo Random Number Generators for Cryptographic Applications. NIST Special Publication, Gaithersburg.

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