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Yoon, J.-W., Kim, S.-W., Koo, J.-M., Kim, D.-G. and Jung, S.-B. (2004) Reliability Investigation and Interfacial Reaction of Ball-Grid-Array Packages Using the Lead-Free Sn-Cu Solder. Journal of Electronic Materials, 33, 1190.
http://dx.doi.org/10.1007/s11664-004-0122-x

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