TITLE:
Solid-State Reaction and Vacancy-Type Defects in Bilayer Fe/Hf Studied by the Slow Positron Beam
AUTHORS:
K. Yamada, T. Sasaki, T. Nagata, I. Kanazawa, R. Suzuki, T. Ohdaira, K. Nozawa, F. Komori
KEYWORDS:
Metallic Films, Positron Annihilation Measurement, Solid-State Reaction, Fe Film, Diffusion, Vacancy-Type Defects
JOURNAL NAME:
Journal of Applied Mathematics and Physics,
Vol.3 No.2,
January
30,
2015
ABSTRACT:
The positron annihilation
lifetimes and the Doppler broadening by slow positron beam are measured in thin
Fe films with thickness 500 nm, a thin Hf film with thickness 100 nm, and the
bilayer Fe (50 nm)/Hf (50 nm) on quartz glass substrate. We have analyzed the behavior
in vacancy-type defects in each layer through some deposition temperatures and
annealing. It is observed that the thin Fe film, the thin Hf film, and the
bilayer Fe (50 nm)/Hf (50 nm) already contain many vacancy-type defects. We
have investigated the change of densities of the vacancy-carbon complex and the
small vacancy-cluster with carbons, through solid-state amorphization of Fe (50
nm)/Hf (50 nm) bilayer.