Benoy, M.D., Mohammed, E.M., Suresh, B.M., Binu, P.J. and Pradeep, B. (2009) Thickness Dependence of the Properties of Indium Tin Oxide (ITO) FILMS Prepared by Activated Reactive Evaporation. Brazilian Journal of Physics, 39.

has been cited by the following article:

• TITLE: Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film

  AUTHORS: Golam Saklayen, Shahinul Islam, Ferdous Rahman, Abu Bakar Ismail

  KEYWORDS: E-Beam Deposition, Surface Morphology, Thin Films, EDX, Atomic Force Microscopy, SEM, Annealing, Electrical and Optical Properties

  JOURNAL NAME: Advances in Materials Physics and Chemistry, Vol.4 No.10, October 23, 2014

  ABSTRACT: The following article has been retracted due to the fact that the authors practise fraud. The scientific community takes a very strong view on this matter, and the Advances in Materials Physics and Chemistry treats all unethical behavior seriously. This paper published in Vol. 4 No. 10 194-202, 2014 has been removed from this site. Title: Investigation on the Effect of Film Thickness on the Surface Morphology, Electrical and Optical Properties of E-Beam Deposited Indium Tin Oxide (ITO) Thin Film Authors: Golam Saklayen, Shahinul Islam, Ferdous Rahman, Abu Bakar Ismail