Article citationsMore>>

N. T. Bagraev, V. A. Mashkov, “A Mechanism for Two-Electron Capture at Deep Level Defects in Semiconductors, Solid State Communications,” Solid State Communications, Vol. 65, No. 12, 1988, pp. 1111-1117. doi:10.1016/0038-1098(88)90904-0

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top