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G. Meneghesso, B. Cogliati, G. Donzelli, D. Sala and E. Zanoni, “Development of Kink in the Output I-V Characteristics OF Pseudomorphic HEMTs after Hot-Electron Accelerated Aging,” Microelectronics Reliability, Vol. 37, No. 10-11, 1997, pp. 1679-1682. doi:10.1016/S0026-2714(97)00138-8

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