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Byun, Y.H., Shur, M.S., Peczalski, A. and Schuermeyer, F.L. (1988) Gate-Voltage Dependence of Source and Drain Series Resistances and Effective Gate Length in GaAs MESFETs. IEEE Transactions on Electron Devices, 35, 1241-1246.
https://doi.org/10.1109/16.2543

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