Article citationsMore>>

Klein, P.B. and Binari, S.C. (2003) Photoionization Spectroscopy of Deep Defects Responsible for Current Collapse in Nitride-Based Field Effect Transistors. Journal of Physics: Condensed Matter, 15, R1641-R1667.
https://doi.org/10.1088/0953-8984/15/44/R01

has been cited by the following article:

Follow SCIRP
Twitter Facebook Linkedin Weibo
Contact us
+1 323-425-8868
customer@scirp.org
WhatsApp +86 18163351462(WhatsApp)
Click here to send a message to me 1655362766
Paper Publishing WeChat
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top