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S. Zafar, K.A. Conrad, G. Liu, E. A. Irene, G. Hames, R. Kuehn and J. J. Wortman, “Thickness and Effective Electron Mass Measurements for Thin Silicon Dioxide Films Using Tunneling Current Oscillations,” Applied Physics Letters, Vol. 67, No. 7, 1995, pp.1031-1033.
doi:10.1063/1.114720
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