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I. V. Minin, O. V. Minin, D. Prather, S. Shi, “The potential of flat curvilinear DOE as a key element of future integrated diffractive optics and information protected element,” In Proceeding of the 5th IEEE-Russia Conference “Microwave electronics: measurements, identification, applications,” MEMIA 2005, pp. 13-15, December 2005, Novosibirsk, Russia, pp. 186–193.
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