Proceedings of 2010 Asia-Pacific Youth Conference on Communication (APYCC 2010 E-BOOK)

Kunming,China,8.7-8.8,2010

ISBN: 978-1-935068-13-6 Scientific Research Publishing, USA

E-Book 542pp Pub. Date: August 2010

Category: Computer Science & Communications

Price: $80

Title: Development of Endurance Speed Test System for New Type Motorcycles Based on ARM
Source: Proceedings of 2010 Asia-Pacific Youth Conference on Communication (APYCC 2010 E-BOOK) (pp 474-478)
Author(s): Minjun Jiang, School of Information Engineering, Nanchang HangKong University, Nanchang, China
Qi Wang, School of Information Engineering, Nanchang HangKong University, Nanchang, China
Guangyao Zhang, School of Information Engineering, Nanchang HangKong University, Nanchang, China
Mingguang Gong, School of Information Engineering, Nanchang HangKong University, Nanchang, China
Mingjing Zhao, School of Information Engineering, Nanchang HangKong University, Nanchang, China
Abstract: According to the increased requirement and method of pollution control device endurance test for standard of limits and measurement methods for the emissions of pollutants from motorcycles on the running mode (CHINA stage ), we developed a new type endurance speed test system of motorcycle Ⅲ s. The system hardware was based on the ARM9 hardware platform, and GPS as core. Software design included two parts of the lower and host computer. Lower one used the embedded operating system Windows CE 5.0 as a soft- ware design platform. Application software program used EVC++ 4.0 to design based MFC. Test vehicles obtained real-time speed by parsing the GPS output information to instruct tester for test in accordance with the setting model curve. Host software was developed by Delphi, mainly for model editing, playback, analysis and processing of experimental data. The system has the advantages of high-performance, precision, easy in- stallation and operation, also a good prospect.
Free SCIRP Newsletters
Copyright © 2006-2024 Scientific Research Publishing Inc. All Rights Reserved.
Top