Author(s): |
Yan Shen, School of Electronic and Information Engineering, Beijing Jiaotong University, Beijing 100044 Xinmin Wang, Beijing Wireless Measurement Institute, Beijing 100039 Houjin Chen, School of Electronic and Information Engineering, Beijing Jiaotong University, Beijing 100044 Xiaoli Hao, School of Electronic and Information Engineering, Beijing Jiaotong University, Beijing 100044 |