Author(s): |
Li-hua Chen, Dept. Electronic Science and Engineering of Jilim University,Changchun, P R China, Kui-xue Liu, Dept. Electronic Science and Engineering of Jilim University,Changchun, P R China, Yu-dong Zhao, Dept. Electronic Science and Engineering of Jilim University,Changchun, P R China, Shao-peng Chang, Dept. Electronic Science and Engineering of Jilim University,Changchun, P R China, Feng-min Liu, Dept. Electronic Science and Engineering of Jilim University,Changchun, P R China, |