Proceedings of the 7th National Conference on Functional Materials and Applications (FMA 2010 E-BOOK)

Changsha,China,10.16-10.18,2010

ISBN: 978-1-935068-41-9 Scientific Research Publishing, USA

E-Book 2313pp Pub. Date: October 2010

Category: Chemistry & Materials Science

Price: $360

Title: Prepare for C60 Thin Films Using the Way of Thermal Evaporation in Vacuum Chamber*
Source: Proceedings of the 7th National Conference on Functional Materials and Applications (FMA 2010 E-BOOK) (pp 450-452)
Author(s): Xue-liang Yang, School of Applied Mathematics and Physics, Beijing University of Technology, Beijing, China
Jin-xiang Deng, School of Applied Mathematics and Physics, Beijing University of Technology, Beijing, China
Le Kong, School of Applied Mathematics and Physics, Beijing University of Technology, Beijing, China
Ping Yang, School of Applied Mathematics and Physics, Beijing University of Technology, Beijing, China
Abstract: C60 thin films were deposited on Si substrate by thermal evaporation method with the various heating source temperatures. The films thickness were measured using dektak 150 surface profiler and the depositing rate of films were obtained. The microstructure properties of the films were studied using low angle X-ray diffraction (LA-XRD) technique. Their surface morphology and root mean square (RMS) were investigated using atomic force microscope (AFM). A predominating texture component C60 thin film with a strong indication of (333) orientation peak is extracted from the studying of LA-XRD measurements with information 11.6nm of the average grain size of C60 thin film grown on Si under 450℃ heating source. It is clearly shown that smooth, continuous and uniform C60 thin films which have less holes and smaller RMS were prepared at 450℃ for heating source by analysis of the AFM image. A process preparing good C60 thin film was obtained which was in favor of fabricating C60-based organic solar cells, and it played an important role in improving its photoelectric conversion efficiency.
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