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Proceedings of the 7th National Conference on Functional Materials and Applications (FMA 2010 E-BOOK)

Changsha,China,10.16-10.18,2010

ISBN: 978-1-935068-41-9 Scientific Research Publishing, USA

E-Book 2313pp Pub. Date: October 2010

Category: Chemistry & Materials Science

Price: $360

Title: Growth and Characterization of CeO2 Thin Film by Laser Molecular-Beam Epitaxy
Source: Proceedings of the 7th National Conference on Functional Materials and Applications (FMA 2010 E-BOOK) (pp 54-57)
Author(s): Jun Chen, National Key Laboratory for Surface Physics and Chemistry, Mianyang，China
Fang-fang Ge, The Centre of Laser Fusion Research, China Academy of Engineering Physics,Mianyang,China
Hong-liang Zhang, The Centre of Laser Fusion Research, China Academy of Engineering Physics,Mianyang,China
Xue-ming Wang, The Centre of Laser Fusion Research, China Academy of Engineering Physics,Mianyang,China
Abstract: Using metal Ce as target, epitaxial CeO2 thin films were grown on SrTiO3 substrates by laser molecular-beam epitaxy with oxygen atmosphere. The clear bar diffraction patterns of CeO2 thin film were observed by in-situ RHEED,it shows the growth model of thin film is sandwich.XRD spectrum indicates the structural properties of CeO2 thin film is good structure with (200)and (400) orientation. The AFM shows that the thin film has a atuomically smooth surface and the root-mean-square roughness of 0.272 nm over a 2μm×2μm area.
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