[1]
|
Zernike, F. and Prins, J.A. (1927) Die Beugung von Rontgenstrahlen in Flussigkeiten als Effekt der Molekulanordnung. Zeitschrift fur Physik, 41, 184-194. http://dx.doi.org/10.1007/BF01391926
|
[2]
|
Warren, B.E. (1969) X-Ray Diffraction. Addison-Wesley, Reading.
|
[3]
|
Hosemann, R. and Bagchi, S.N. (1962) Direct Analysis of Diffraction by Matter. North-Holland, Amsterdam.
|
[4]
|
Hall, I.H. and Somashekar, R. (1991) The Determination of Crystal Size and Disorder from the X-Ray Diffraction Photograph of Polymer Fibres. 2. Modelling Intensity Profiles. Journal of Applied Crystallography, 24, 1051. http://dx.doi.org/10.1107/S0021889891007707
|
[5]
|
Balzar, D. (1993) X-Ray Diffraction Line Broadening: Modeling and Applications to High-Tc Superconductors. Journal of Research of the National Institute of Standards and Technology, 98, 321. http://dx.doi.org/10.6028/jres.098.026
|
[6]
|
Delhez, R., de Keijser, Th.H., Langford, J.L., Louer, D., Mittemeijer, E.J. and Sonneveld, E.J. (1993)
|
[7]
|
Langford, J.I. and Lour, D. (1982) Diffraction Line Profiles and Scherrer Constants for Materials with Cylindrical Crystallites. Journal of Applied Crystallography, 15, 20-26. http://dx.doi.org/10.1107/S0021889882011297
|
[8]
|
Scardi, P. and Leoni, M. (2002) Whole Powder Pattern Modeling. Acta Crystallographica Section A. Foundations of Crystallography, 58, 190-200. http://dx.doi.org/10.1107/S0108767301021298
|
[9]
|
Nandi, R.K., Kuo, H.K., Schlosberg, W., Wissler, G., Cohen, J.B. and Crist Jr., B. (1984) Single-Peak Methods for Fourier Analysis of Peak Shapes. Journal of Applied Crystallography, 17, 22-26. http://dx.doi.org/10.1107/S0021889878012662
|
[10]
|
Klug, H.P. and Alexander, L.E. (1974) X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials. 2nd Edition, Wiley, New York.
|
[11]
|
Kuzel Jr., R. and Klimanek, P. (1989) X-Ray Diffraction Line Broadening Due to Dislocations in Non-Cubic Crystalline Materials. III. Experimental Results for Plastically Deformed Zirconium. Journal of Applied Crystallography, 22, 299-307. http://dx.doi.org/10.1107/S0021889889001585
|
[12]
|
Rietveld, H.M. (1969) A Profile Refinement Method for Nuclear and Magnetic Structures. Journal of Applied Crystallography, 2, 65-71. http://dx.doi.org/10.1107/S0021889869006558
|
[13]
|
Young, R.A. (1995) The Rietveld Method. Oxford University Press, Oxford, 132-166.
|
[14]
|
Ungar, T., Gubicza, J., Ribarik, G. and Borbely, A. (2001) Crystallite Size Distribution and Dislocation Structure Determined by Diffraction Profile Analysis: Principles and Practical Application to Cubic and Hexagonal Crystals. Journal of Applied Crystallography, 34, 298-310. http://dx.doi.org/10.1107/S0021889801003715
|
[15]
|
Snyder, R.J., Fiala, J. and Bunge, H.J. (1999) Defect and Microstructure Analysis by Diffraction. Oxford University Press, Oxford.
|
[16]
|
Somashekar, R., Hall, I.H. and Carr, P.D. (1989) The Determination of Crystal Size and Disorder from X-Ray Diffraction Photographs of Polymer Fibres. 1. The Accuracy of Determination of Fourier Coefficients of the Intensity Profile of a Reflection. Journal of Applied Crystallography, 22, 363-371. http://dx.doi.org/10.1107/S0021889889004085
|
[17]
|
Lee, K.G., Barton, R. and Schultz, J.M. (1995) Structure and Property Development in Poly(P-Phenylene Terephthalamide) during Heat Treatment under Tension. Journal of Polymer Science Part B: Polymer Physics, 33, 1-14. http://dx.doi.org/10.1002/polb.1995.090330101
|
[18]
|
Somashekar, R. and Somashekarappa, H. (1997) X-Ray Diffraction-Line Broadening Analysis: Paracrystalline Method. Journal of Applied Crystallography, 30, 147-152. http://dx.doi.org/10.1107/S0021889896010023
|
[19]
|
Balzar, D., Audebrand, N., Daymond, M.R., Fitch, A., Hewat, A., Langford, J.I., Le Bail, A., Lour, D., Masson, O., McCowan, C.N., Popa, N.C., Stephens, P.W. and Toby, B.H. (2004) Journal of Applied Crystallography, 37, 911-924. http://dx.doi.org/10.1107/S0021889804022551
|
[20]
|
Skoko, Z., Popovic, J., Dekanic, K., Kolbas, V. and Popovi, S. (2012) XBroad: Program for Extracting Basic Microstructure Information from X-Ray Diffraction Patterns in Few Clicks. Journal of Applied Crystallography, 45, 584-597. http://dx.doi.org/10.1107/S0021889812014859
|
[21]
|
Beyerlien, K.R., Snyder, R.L. and Scardi, P. (2011) Powder Diffraction Line Profiles from the Size and Shape of Nanocrystallites. Journal of Applied Crystallography, 44, 945-953. http://dx.doi.org/10.1107/S0021889811030743
|
[22]
|
Leonardi, A., Leoni, M., Siboni, S. and Scardi, P. (2012) Common Volume Functions and Diffraction Line Profiles of Polyhedral Domains. Journal of Applied Crystallography, 45, 1162-1172. http://dx.doi.org/10.1107/S0021889812039283
|
[23]
|
Stokes, A.R. (1948) A Numerical Fourier-Analysis Method for the Correction of Widths and Shapes of Lines on X-Ray Powder Photographs. Proceedings of the Physical Society, 61, 382-391. http://dx.doi.org/10.1088/0959-5309/61/4/311
|
[24]
|
Bhajantria, R.F., Ravindrachary, V., Harisha, A., Crasta, V., Nayak, S.P. and Poojary, B. (2006) Microstructural Studies on BaCl2 Doped Poly(Vinyl Alcohol). Polymer, 47, 3591-3598. http://dx.doi.org/10.1016/j.polymer.2006.03.054
|
[25]
|
Lakshmeesha Rao, B., Mahadevaiah, O., Sangappa, Y., Asha, S. and Somashekar, R. (2012) Microstructural Parameters in Electron Irradiated PVA Films by Wide Angle X-Ray Scattering Studies (WAXS). Advanced Materials Research, 585, 532-536. http://dx.doi.org/10.4028/www.scientific.net/AMR.585.532
|
[26]
|
Divakara, S., Siddaraju, G.N. and Somashekar, R. (2010) Comparative Study of Natural and Man-Made Polymers Using Whole Powder Pattern Fitting Technique. Fibres and Polymers, 11, 861-868. http://dx.doi.org/10.1007/s12221-010-0861-7
|
[27]
|
Sangappa, Demappa, T., Mahadevaiah, Ganesh, S., Divakara, S. and Somashekar, R. (2008) Microstructural Parameters in Electron-Irradiated Hydroxypropyl Methylcellulose Films Using X-Ray Line Profile Analysis. Journal of Applied Polymer Science, 109, 3983-3990. http://dx.doi.org/10.1002/app.28495
|
[28]
|
Divakara, S., Madhu, S. and Somashekar, R. (2009) Stacking Faults and Microstructural Parameters in Non-Mulberry Silk Fibres. Pramana, 73, 927-938. http://dx.doi.org/10.1007/s12043-009-0159-8
|
[29]
|
Divakara, S., Somashekar, R. and Roy, S. (2009) Correlation between Microstructure and Microrheological Parameters of Various Silk Fibres. Indian Journal of Fibre and Textile Research, 34, 168-174.
|
[30]
|
Reddy, T., Roy, S., Prakash, Y., Somashekarappa, H., Ramesh, K., Divakara, S. and Somashekar, R. (2011) Stress-Strain Curves and Corresponding Structural Parameters in Mulberry and Non-Mulberry Silk Fibers. Fibers and Polymers, 12, 499-505. http://dx.doi.org/10.1007/s12221-011-0499-0
|
[31]
|
Niranjana, A.R., Divakara, S. and Somashekar, R. (2011) Characterization of Field Grown Cotton Fibres Using Whole Powder Pattern Fitting Method. Indian Journal of Fibre and Textile Research, 36, 9-17.
|
[32]
|
Abhishek, S., Samir, O.M., Annadurai, V., Gopalkrishne Urs, R., Mahesh, S.S. and Somashekar, R. (2005) Role of Micro-Crystalline Parameters in the Physical Properties of Cotton Fibers. European Polymer Journal, 41, 2916-2922. http://dx.doi.org/10.1016/j.eurpolymj.2005.06.005
|