Transmittance Measurement of the Nonplanar Optical Based on Focal-Plane-Array Camera

Chengzhi Su, Fei’ou Jiang, Yan Zhuang, Guohua Cao

College of Electro-Mechanical Engineering, Changchun University of Science and Technology, Changchun, China.

DOI: 10.4236/eng.2012.46037                

Abstract

Aiming to solve the problem that it is difficult to accurately measure UV cut-off transmittance of xenon quartz glass by using present spectrophotometer in China SG III project. Through the analysis, we believe that its reason was that the xenon quartz glass was nonplanar so the outgoing beam geometry from under-test was different from that from standard sample. A method of transmittance measurement based on focal-plane-array camera was proposed in this article. The effects of camera uniformity and spot sampling on transmittance measurement were analyzed theoretically. This method, which can reduce the effect of beam geometry on transmittance measurement and eliminate the cutting error occurring during light transmission by monitoring the completeness of incident beam in real-time, is verified from experiments. The random standard uncertainty of this method here is 0.035% or less. It is particularly useful in the transmittance measurement of nonplanar optical.

Keywords

Transmittance Measurement; Nonplanar Optical; Focal-Plane-Array Camera

Conflicts of Interest

The authors declare no conflicts of interest.

References

[1]	H.-B. Li, L.-L. Hu, W.-Z. Lin, et al., “Study on Properties of Cerium-Doped Silica Glass Tube for Xenon Flash Lamp,” Chinese Journal of Lasers, Vol. 31, No. 6, 2004, pp. 654- 658.
[2]	P. Y. Wu, P. F. Gu and J. F. Tang, “Spectrophotometer for Measuring Spectral Reflectance and Transmittance,” Applied Optics, Vol. 33, No. 10, 1994, pp. 1975-1979. doi:10.1364/AO.33.001975
[3]	E. R. Woolliams, D. F. Pollard, N. J. Harrison, E. Theocharous and N. P. Fox, “New Facility for the High Accuracy Measurement of Lens Transmission,” Metrologia, Vol. 37, 2000, pp. 603-605. doi:10.1088/0026-1394/37/5/59
[4]	L. Hanssen, “Integrating-Sphere Element and Method for Absolute Measurement of Transmittance, Reflectance, and Absorptance of Specular Samples,” Applied Optics, Vol. 40, No. 19, 2001, pp. 3196-3204. doi:10.1364/AO.40.003196
[5]	E. I. Dmitriev, O. K. Filippov and V. G. Filippov, “Apparatus for Measuring the Spectral Directed Transmittance of Wide-Aperture Opticals,” Journal of Optical Technology, Vol. 75, No. 1, 2008, pp. 57-58.
[6]	Z.-J. Yang and Y.-M. Li, “New Advances of Optical Metrology and Measurement in National Defence,” Chinese Applied Optics, Vol. 22, No. 4, 2001, pp. 35-39.
[7]	W.-H. Bi, B.-J. Zhang, Y. Zhang and G.-W. Fu, “Novel Measurement of Coated Glass Visible Light Transmittance,” Chinese Opto-Electronic Engineering, Vol. 35, No. 4, 2008, pp. 53-57.
[8]	Z. W. Yang, “Optical Measurement,” Beijing Institute of Technology Press, Beijing, 1995.
[9]	Xi’an Institute of Applied Optics in National Defense of China, “Fine Measure Instrument.” www.jungong.net.images/gbz/jilang/jgj2.doc
[10]	J. Cheung, J. L. Gardner, A. Migdall, S. Polyakov and M. Ware, “High Accuracy Dual Lens Transmittance Measurements,” Applied Optics, Vol. 46, No. 22, 2007, pp. 5396- 5400. doi:10.1364/AO.46.005396