Journal of Modern Physics

Journal of Modern Physics

ISSN Print: 2153-1196
ISSN Online: 2153-120X
www.scirp.org/journal/jmp
E-mail: jmp@scirp.org
"Characteristics of GaN Thin Films Using Magnetron Sputtering System"
written by Hasina F. Huq, Rocio Y. Garza, Roman Garcia-Perez,
published by Journal of Modern Physics, Vol.7 No.15, 2016
has been cited by the following article(s):
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[1] Growth Optimization of Nonpolar Al0.7Sc0.3N()/Al2O3() Thin Films Using Reactive Magnetron Sputter Epitaxy
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[2] Intelligent Battery Switching Module for Hybrid Electric Aircraft
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[3] Effects in the Optical and Structural Properties Caused by Mg or Zn Doping of GaN Films Grown via Radio-Frequency Magnetron Sputtering Using Laboratory …
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[4] Synthesis gallium nitride thin films by pulsed laser deposition as ammonia (NH 3) gas sensor
J. Optoelectron. Biomed. Mater, 2020
[5] Characterization of Amorphous GaN Thin Films after Conventional Thermal Anneal
2020
[6] 120 MeV Ag ion irradiation induced intermixing, grain fragmentation in HfO2/GaOx thin films and consequent effects on the electrical properties of HfO2/GaOx/Si …
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[7] SYNTHESIS GALLIUM NITRIDE THIN FILMS BY PULSED LASER DEPOSITION AS AMMONIA (NH3) GAS SENSOR
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[8] Высокочастотный источник газового разряда
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[9] A Study of the Elemental and Surface Characterization of AlGaN/GaN HEMT by Magnetron Sputtering System
2019
[10] Substrates Effect on the Phase Transition of GaN Thin Films by Sputter Deposition
2019
[11] Sputtered Gallium Nitride Tunnel Junction Contacts
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[12] Effect of Argon Flow to the Growth of Aluminum Nitride Thin Films using RF Magnetron Sputtering
2019
[13] Handbook for III-V High Electron Mobility Transistor Technologies
2019
[14] Processing and characterization of a free-standing bulk polycrystalline GaN layer
Journal of Alloys and Compounds, 2018
[15] A review of nanostructured thin films for gas sensing and corrosion protection
2018
[16] AlGaN/GaN HEMT by Magnetron Sputtering at Room Temperature
Journal of Nanomaterials, 2017
[17] Algan/Gan Hemt By Magnetron Sputtering System
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