"On the Production Testing of Memristor Ratioed Logic (MRL) Gates"
written by Ahmed Shukry Emara, Ahmed Hassan Madian, Hassanein Hamed Amer, Sherif Hassanein Amer, Mohamed Bakr Abdelhalim,
published by Circuits and Systems, Vol.7 No.10, 2016
has been cited by the following article(s):
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