has been cited by the following article(s):
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[1]
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Physical model for the frequency dependence of time-dependent dielectric breakdown (TDDB)
AIP Advances,
2023
DOI:10.1063/5.0150268
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[2]
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Modified Dynamic Physical Model of Valence Change Mechanism Memristors
ACS Applied Materials & Interfaces,
2022
DOI:10.1021/acsami.2c10944
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[3]
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Dielectric breakdown of 2D muscovite mica
Scientific Reports,
2022
DOI:10.1038/s41598-022-18320-7
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[4]
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Modified Dynamic Physical Model of Valence Change Mechanism Memristors
ACS Applied Materials & Interfaces,
2022
DOI:10.1021/acsami.2c10944
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[5]
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Dielectric Breakdown in Single-Crystal Hexagonal Boron Nitride
ACS Applied Electronic Materials,
2021
DOI:10.1021/acsaelm.1c00469
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[6]
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Dielectric Breakdown in Single-Crystal Hexagonal Boron Nitride
ACS Applied Electronic Materials,
2021
DOI:10.1021/acsaelm.1c00469
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