Microscopy Research

Microscopy Research

ISSN Print: 2329-3306
ISSN Online: 2329-3314
www.scirp.org/journal/mr
E-mail: mr@scirp.org
"Quantitative Evaluation of an Epitaxial Silicon-Germanium Layer on Silicon"
written by Jie-Yi Yao, Kun-Lin Lin, Chiung-Chih Hsu,
published by Microscopy Research, Vol.3 No.4, 2015
has been cited by the following article(s):
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