Materials Sciences and Applications

Materials Sciences and Applications

ISSN Print: 2153-117X
ISSN Online: 2153-1188
www.scirp.org/journal/msa
E-mail: msa@scirp.org
"Densification of Thin Aluminum Oxide Films by Thermal Treatments"
written by V. Cimalla, M. Baeumler, L. Kirste, M. Prescher, B. Christian, T. Passow, F. Benkhelifa, F. Bernhardt, G. Eichapfel, M. Himmerlich, S. Krischok, J. Pezoldt,
published by Materials Sciences and Applications, Vol.5 No.8, 2014
has been cited by the following article(s):
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[17] Atomic layer deposition Al2O3-passivated AlGaN/GaN high-electron-mobility transistors on Si (111) towards reliable high-speed electronics
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[57] Fluoride removal in waters using ionic liquid-functionalized alumina as a novel adsorbent
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[63] Normally-off fully recess-gated GaN metal–insulator–semiconductor field-effect transistor using Al2O3/Si3N4 bilayer as gate dielectrics
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[72] Integrated low‐temperature process for the fabrication of amorphous Si nanoparticles embedded in Al2O3 for non‐volatile memory application
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[77] Improving the photoelectrocatalytic performance of boron-modified TiO2/Ti sol–gel-based electrodes for glycerol oxidation under visible illumination
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[78] Influences of annealing on structural and compositional properties of Al_2O_3 thin films grown on 4H–SiC by atomic layer deposition
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[79] Corrosion barriers for silver-based telescope mirrors: comparative study of plasma-enhanced atomic layer deposition and reactive evaporation of aluminum oxide
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[80] Nucleation, Growth, and Electrical Characterization of Al2O3 Thin Films Grown by Atomic Layer Deposition
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[81] Metalorganic chemical vapor deposition of Al 2 O 3 using trimethylaluminum and O 2 precursors: Growth mechanism and crystallinity
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