The Role of Sputtering Current on the Optical and Electrical Properties of Si-C Junction

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ISSN Print: 2161-4954
ISSN Online: 2161-4962
www.scirp.org/journal/wjnse
E-mail: wjnse@scirp.org

"The Role of Sputtering Current on the Optical and Electrical Properties of Si-C Junction"
written by Mohammad M. Uonis, Bassam M. Mustafa, Anwar M. Ezzat,
published by World Journal of Nano Science and Engineering, Vol.4 No.2, 2014

has been cited by the following article(s):

[1]	The Effect of Sputtering Current and Carbon Layer Thickness on the CV Characteristics of Si-CNT
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[2]	Preparation of ZnTe thin films using chemical bath deposition technique
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[3]	EFFECT OF HEAT AND LIGHT ON ELECTRICAL PROPERTIES OF SI-CNT JUNCTION
	2020

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