A New Analyzing Method of Single Event Latch-Up Protection Circuit Based on Current Comparing and Its Performance Verification

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ISSN Print: 2153-1196
ISSN Online: 2153-120X
www.scirp.org/journal/jmp
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"A New Analyzing Method of Single Event Latch-Up Protection Circuit Based on Current Comparing and Its Performance Verification"
written by Pengwei Li, Xiaoyun Fu, Lei Luo, Qingkui Yu,
published by Journal of Modern Physics, Vol.5 No.6, 2014

has been cited by the following article(s):

[1]	Radiation Hardness Assurance of Single Event Effects on Components for Space Application
	… on Radiation Effects …, 2021

[2]	Investigation of CMOS Multiplexor SEL Sensitivity at Low Temperature
	2020

[3]	Single event latch-up detection for nano-satellite external solar radiation mitigation system
	2020

[4]	Configurable single event latch-up (SEL) and electrical overvoltage stress (EOS) detection circuit
	2019

[5]	Investigation of SEE Breakdown in CCD Image Sensor
	2018

[6]	Latent Single-Event Latchup-induced damage in Complementary Metal-Oxide-Semiconductor
	2018

[7]	BIRDS Project Newsletter
	2016

[1]	Radiation Hardness Assurance of Single Event Effects on Components for Space Application 2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED), 2021 DOI:10.1109/ICREED52909.2021.9588712

[2]	Latent Single-Event Latchup-induced damage in Complementary Metal-Oxide- Semiconductor 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2018 DOI:10.1109/RADECS45761.2018.9328692

[3]	Investigation of SEE Breakdown in CCD Image Sensor 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2018 DOI:10.1109/RADECS45761.2018.9328684

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