Characterization of Thin Films by Low Incidence X-Ray Diffraction

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Crystal Structure Theory and Applications

ISSN Print: 2169-2491
ISSN Online: 2169-2505
www.scirp.org/journal/csta
E-mail: csta@scirp.org

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"Characterization of Thin Films by Low Incidence X-Ray Diffraction"
written by Mirtat Bouroushian, Tatjana Kosanovic,
published by Crystal Structure Theory and Applications, Vol.1 No.3, 2012

has been cited by the following article(s):

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