Special Issue on X-Ray Spectrometry
X-ray
spectrometry is used for chemical analysis in fields as diverse as mining,
medical research, polymer manufacturing, geology, and consumer product quality
control, etc. The goal of this special issue is to provide a platform for
scientists and academicians all over the world to promote, share, and discuss
various new issues and developments in area of X-Ray Spectrometry.
In this special issue, we intend to invite
front-line researchers and authors to submit original research and review
articles on exploring X-Ray Spectrometry. Potential topics include, but are not limited to:
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Materials characterization
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Development of X-ray spectroscopy
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Applications of X-ray spectroscopy
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X-Ray analysis and techniques
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X-ray crystallography
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Instruments and approaches of X-ray
spectroscopy
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X-ray detection and spectrometer design
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X-ray absorption/emission processes
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X-ray fluorescence spectrometry
Authors should read over the journal’s For Authors carefully
before submission. Prospective authors should submit an electronic copy of
their complete manuscript through the journal’s Paper Submission System.
Please kindly specify the “Special Issue”
under your manuscript title. The research field “Special Issue - X-Ray
Spectrometry” should be selected during your submission.
Special Issue Timetable:
Submission Deadline
|
September 18th, 2016
|
Publication Date
|
November 2016
|
Guest
Editor:
For further
questions or inquiries, please contact Editorial Assistant at
ajac@scirp.org.