Special Issue on Electron Spectroscopy Technology 

Electron Spectroscopy Technology is an analytical technique to study the electronic structure and its dynamics in atoms and molecules. The technology could directly detection structures of electron shell from sample atoms and molecules in a wide range of materials. According to the difference of electron excitation source, the electron spectroscopy has including X-ray photoelectron spectroscopy (XPS), Ultraviolet photoelectron spectroscopy (UPS), Auger electron spectroscopy (AES) and others. Electron spectroscopy technology is sensitive to as low as 0.1 atom percent and detects elements except H and He. It is non-destructive and it can be applied to all solid materials, such as polymers and glasses. This special issue will be focused on studying different kinds of electron spectroscopy technology and its applications.  

In this special issue, we intend to invite front-line researchers and authors to submit original research and review articles on exploring electron spectroscopy technology. Potential topics include, but are not limited to:

• X-ray photoelectron spectroscopy (XPS) technology
• Ultraviolet photoelectron spectroscopy (UPS) technology
• Auger electron spectroscopy (AES) technology
• Photoemission spectroscopy and other technologies
• Atomic and molecular physics, clusters
• Analysis of solids surface and interface
• Analyzer of electron spectroscopy
• Applications of electron spectroscopy
  
  

Authors should read over the journal’s For Authors carefully before submission. Prospective authors should submit an electronic copy of their complete manuscript through the journal’s Paper Submission System.

Please kindly notice that the “Special Issue” under your manuscript title is supposed to be specified and the research field “Special Issue - Electron Spectroscopy Technology” should be chosen during your submission.

According to the following timetable:

Guest Editor:

For further questions or inquiries

Please contact Editorial Assistant at

ajac@scirp.org